Timing yield analysis considering process-induced temperature and supply voltage variations
Author's Department
Electronics & Communications Engineering Department
Find in your Library
https://doi.org/10.1016/j.mejo.2012.07.014
Document Type
Research Article
Publication Title
Microelectronics Journal
Publication Date
12-1-2012
doi
10.1016/j.mejo.2012.07.014
First Page
956
Last Page
961
Recommended Citation
APA Citation
Haghdad, K.
&
Anis, M.
(2012). Timing yield analysis considering process-induced temperature and supply voltage variations. Microelectronics Journal, 43(12), 956–961.
10.1016/j.mejo.2012.07.014
https://fount.aucegypt.edu/faculty_journal_articles/2087
MLA Citation
Haghdad, Kian, et al.
"Timing yield analysis considering process-induced temperature and supply voltage variations." Microelectronics Journal, vol. 43,no. 12, 2012, pp. 956–961.
https://fount.aucegypt.edu/faculty_journal_articles/2087