Power grid analysis and verification considering temperature variations

Authors

Kian Haghdad, University of Waterloo
Javid Jaffari, University of Waterloo
Mohab Anis, American University in CairoFollow

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1016/j.mejo.2011.12.008

Document Type

Research Article

Publication Title

Microelectronics Journal

Publication Date

3-1-2012

doi

10.1016/j.mejo.2011.12.008

First Page

189

Last Page

197

Recommended Citation

APA Citation

Haghdad, K. Jaffari, J. & Anis, M. (2012). Power grid analysis and verification considering temperature variations. Microelectronics Journal, 43(3), 189–197. 10.1016/j.mejo.2011.12.008
https://fount.aucegypt.edu/faculty_journal_articles/2161

MLA Citation

Haghdad, Kian, et al. "Power grid analysis and verification considering temperature variations." Microelectronics Journal, vol. 43,no. 3, 2012, pp. 189–197.
https://fount.aucegypt.edu/faculty_journal_articles/2161