A 0.4 V, 12.2 pW Leakage, 36.5 fJ/Step Switching Efficiency Data Retention Flip-Flop in 22 nm FDSOI
Funding Number
62350610271
Funding Sponsor
National Natural Science Foundation of China
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https://doi.org/10.1109/TVLSI.2024.3453946
Document Type
Research Article
Publication Title
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Publication Date
1-1-2024
doi
10.1109/TVLSI.2024.3453946
Abstract
Data-retention flip-flops (DR-FFs) efficiently maintain data during sleep mode, and retain state during transitions between active and sleep mode. This brief proposes an ultralow power DR-FF design with an improved autonomous data-retention (ADR) latch operating with a supply voltage range down to near/subthreshold, achieving a sleep mode leakage power of 12.2 pW, 1.4 × -3.8 × less than the prior CMOS DR-FFs. Our proposed DR-FFs consume the lowest active mode switching efficiency of 36.5 fJ/step, 1.2 × -4 × less than the prior works, and a comparable transition efficiency of 1.9 fJ/step. Furthermore, our proposed DR-FFs require minimal control signals, logic gates, and switches, significantly reducing design complexity, and avoiding the drawbacks of nonvolatile data retention FFs (NV-FFs).
Recommended Citation
APA Citation
Ji, Y.
Zhang, Y.
Chen, C.
Zhao, J.
...
(2024). A 0.4 V, 12.2 pW Leakage, 36.5 fJ/Step Switching Efficiency Data Retention Flip-Flop in 22 nm FDSOI. IEEE Transactions on Very Large Scale Integration (VLSI) Systems,
https://doi.org/10.1109/TVLSI.2024.3453946
MLA Citation
Ji, Yuxin, et al.
"A 0.4 V, 12.2 pW Leakage, 36.5 fJ/Step Switching Efficiency Data Retention Flip-Flop in 22 nm FDSOI." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2024
https://doi.org/10.1109/TVLSI.2024.3453946