Title

Worst-case test vectors for logic faults induced by total dose in ASICs using CMOS processes exhibiting field-oxide leakage

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2011.2128346

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

6-1-2011

doi

10.1109/TNS.2011.2128346

First Page

1047

Last Page

1052

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