Abstract

Charged particles and energetic particles can impact the integrated circuit, referred to as single event effects (SEE). Nuclear reactors and space radiation can produce these particles. These effects can negatively affect the reliability and performance of electronics. When SEE occurs, a transient current is created, which can cause electronic devices to have incorrect outputs and ultimately fail. As a result, ensuring the reliability of ASIC circuits is a significant concern.

This thesis discusses the different fault types, then discuss the soft error and, in particular, the Single Event Transient (SET) and its causes and models. Then, this thesis proposes a new model to get the probability of error of standard cells using a pre-characterized cell module. The proposed method guarantees that no logical masking and over-estimation of the probability of error has occurred. Furthermore, it suggests calculating the error probability of the whole combinational circuit in application-specific integrated circuits (ASIC) using the Krishnaswamy method and a newly proposed method. Finally, this thesis presents a new approach to getting the worst-case vector based on Krishnaswamy and a newly proposed method. The flow gets the most probable vector as the worst-case vector from a set of vectors generated from the Automated Test Pattern Generation (ATPG) tool. In addition, a new error metric is discussed to find the worst-case vector based on two-norm.

School

School of Sciences and Engineering

Department

Electronics & Communications Engineering Department

Degree Name

MS in Electronics & Communication Engineering

Graduation Date

Spring 6-21-2023

Submission Date

5-22-2023

First Advisor

Ahmed Abou-Auf

Committee Member 1

Amr Wassal

Committee Member 2

Yehea Ismail

Committee Member 3

Sherif Abdel Azeem

Extent

118 p.

Document Type

Master's Thesis

Institutional Review Board (IRB) Approval

Approval has been obtained for this item

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