Fault Modeling and Worst Case Test Vector Generation for Flash-Based FPGAs Exposed to Total Dose
Author's Department
Electronics & Communications Engineering Department
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https://doi.org/10.1109/TNS.2017.2687982
Document Type
Research Article
Publication Title
IEEE Transactions on Nuclear Science
Publication Date
8-1-2017
doi
10.1109/TNS.2017.2687982
First Page
2250
Last Page
2258
Recommended Citation
APA Citation
Abou-Auf, A.
Abdel-Aziz, M.
Abdel-Aziz, M.
&
Ammar, A.
(2017). Fault Modeling and Worst Case Test Vector Generation for Flash-Based FPGAs Exposed to Total Dose. IEEE Transactions on Nuclear Science, 64(8), 2250–2258.
10.1109/TNS.2017.2687982
https://fount.aucegypt.edu/faculty_journal_articles/982
MLA Citation
Abou-Auf, Ahmed, et al.
"Fault Modeling and Worst Case Test Vector Generation for Flash-Based FPGAs Exposed to Total Dose." IEEE Transactions on Nuclear Science, vol. 64,no. 8, 2017, pp. 2250–2258.
https://fount.aucegypt.edu/faculty_journal_articles/982