Cost Effectiveness of Coverage in Reliable Factory Automation Systems

Author's Department

Electronics & Communications Engineering Department

Second Author's Department

Electronics & Communications Engineering Department

Third Author's Department

Electronics & Communications Engineering Department

Fourth Author's Department

Electronics & Communications Engineering Department

Fifth Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/ETFA61755.2024.10711104

All Authors

Ahmed E. Mohamed, Hebatallah M. Ibrahim, Ramez M. Daoud, Hassanein H. Amer, Hany M. Elsayed

Document Type

Research Article

Publication Title

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

Publication Date

1-1-2024

doi

10.1109/ETFA61755.2024.10711104

Abstract

Fault-Tolerant (FT) architectures are often used in the context of Industrial Automation, especially in safety-critical systems. Coverage is a very important parameter; it measures the ability of these systems to detect and recover from expected failures. This paper investigates the effect of changes in the value of the Coverage parameter on the steady state availability of several commonly used FT architectures, namely Triple Modular Redundancy (TMR), Sift-Out and Reconfigurable Duplication. When comparing TMR and Sift-Out, it is found that, at relatively low values of coverage, adding redundancy will reduce availability and increase downtime; this is a counter intuitive result. For Reconfigurable Duplication, it is found that, at low Mean Time To Repair (MTTR), the effect of small changes in coverage has little effect on architecture availability. Hence, it is preferable to invest in the quality of the system's redundant modules instead of the quality of the error detection and recovery mechanisms. In contrast, at higher MTTRs, a small increase in the coverage affects availability; hence, investing in the quality of error detection will lower downtime and decrease profit loss.

Comments

Conference Paper. Record derived from SCOPUS.

Link to Full Text
Find this item online

Share

COinS