Fault: Open-Source EDA's Missing DFT Toolchain
Author's Department
Computer Science & Engineering Department
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https://doi.org/10.1109/MDAT.2021.3051850
Document Type
Research Article
Publication Title
IEEE Design and Test
Publication Date
4-1-2021
doi
10.1109/MDAT.2021.3051850
Abstract
An open-source DFT flow is essential for any open-source solution. This article describes an approach to fill in this missing piece. The barrier to fabricating the actual chips is slowly being broken down by projects like OpenROAD and Google Open-Process Design Kit (PDK), which necessitates the existence of an open-source automated flow for DFT. DFT tools also include the infrastructure required for a circuit to support such testing, because the many possible issues that may arise during the fabrication of a hardware design require almost any hardware written to be designed with testability in mind. To this extent, standards have been introduced to assist with automated testing, most famously IEEE 1149.1, which is commonly known as Joint Test Access Group (JTAG).
First Page
45
Last Page
52
Recommended Citation
APA Citation
Abdelatty, M.
Gaber, M.
&
Shalan, M.
(2021). Fault: Open-Source EDA's Missing DFT Toolchain. IEEE Design and Test, 38(2), 45–52.
10.1109/MDAT.2021.3051850
https://fount.aucegypt.edu/faculty_journal_articles/2375
MLA Citation
Abdelatty, Manar, et al.
"Fault: Open-Source EDA's Missing DFT Toolchain." IEEE Design and Test, vol. 38,no. 2, 2021, pp. 45–52.
https://fount.aucegypt.edu/faculty_journal_articles/2375