Statistical design framework of submicron flip-flop circuits considering process variations

Authors

Sayed Alireza Sadrossadat, Carleton University
Hassan Mostafa, University of Waterloo
Mohab Anis, American University in CairoFollow

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TSM.2010.2080693

Document Type

Research Article

Publication Title

IEEE Transactions on Semiconductor Manufacturing

Publication Date

2-1-2011

doi

10.1109/TSM.2010.2080693

First Page

69

Last Page

79

Recommended Citation

APA Citation

Sadrossadat, S. Mostafa, H. & Anis, M. (2011). Statistical design framework of submicron flip-flop circuits considering process variations. IEEE Transactions on Semiconductor Manufacturing, 24(1), 69–79. 10.1109/TSM.2010.2080693
https://fount.aucegypt.edu/faculty_journal_articles/2262

MLA Citation

Sadrossadat, Sayed Alireza, et al. "Statistical design framework of submicron flip-flop circuits considering process variations." IEEE Transactions on Semiconductor Manufacturing, vol. 24,no. 1, 2011, pp. 69–79.
https://fount.aucegypt.edu/faculty_journal_articles/2262