Adaptive body bias for reducing the impacts of NBTI and process variations on 6T SRAM cells

Author's Department

Electronics & Communications Engineering Department

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https://doi.org/10.1109/TCSI.2011.2158708

Document Type

Research Article

Publication Title

IEEE Transactions on Circuits and Systems I: Regular Papers

Publication Date

7-19-2011

doi

10.1109/TCSI.2011.2158708

First Page

2859

Last Page

2871

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