An electrical-aware parametric DFM solution for analog circuits

Author's Department

Electronics & Communications Engineering Department

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https://doi.org/10.1109/IDT.2011.6123104

Document Type

Research Article

Publication Title

International Design and Test Workshop

Publication Date

12-1-2011

doi

10.1109/IDT.2011.6123104

First Page

68

Last Page

73

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