Layout regularity metric as a fast indicator of high variability circuits
Author's Department
Electronics & Communications Engineering Department
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https://doi.org/10.1109/SOCC.2013.6749658
Document Type
Research Article
Publication Title
International System on Chip Conference
Publication Date
1-1-2013
doi
10.1109/SOCC.2013.6749658
First Page
43
Last Page
48
Recommended Citation
APA Citation
Swillam, E.
Madkour, K.
&
Anis, M.
(2013). Layout regularity metric as a fast indicator of high variability circuits. International System on Chip Conference, 43–48.
10.1109/SOCC.2013.6749658
https://fount.aucegypt.edu/faculty_journal_articles/2052
MLA Citation
Swillam, Esraa, et al.
"Layout regularity metric as a fast indicator of high variability circuits." International System on Chip Conference, 2013, pp. 43–48.
https://fount.aucegypt.edu/faculty_journal_articles/2052