Testing of N-Stage 1 bit per stage Pipelined ADC using Test Input Regeneration
Author's Department
Electronics & Communications Engineering Department
Document Type
Research Article
Publication Title
WSEAS Transactions on Circuits and Systems
Publication Date
11-1-2013
First Page
331
Last Page
340
Recommended Citation
APA Citation
Hamed, S.
Khalil, A.
Abdelhalim, M.
Amer, H.
&
Madian, A.
(2013). Testing of N-Stage 1 bit per stage Pipelined ADC using Test Input Regeneration. WSEAS Transactions on Circuits and Systems, 12(11), 331–340.
https://fount.aucegypt.edu/faculty_journal_articles/1941
MLA Citation
Hamed, S. M., et al.
"Testing of N-Stage 1 bit per stage Pipelined ADC using Test Input Regeneration." WSEAS Transactions on Circuits and Systems, vol. 12,no. 11, 2013, pp. 331–340.
https://fount.aucegypt.edu/faculty_journal_articles/1941