Scaling of TG-FinFETs: 3-D Monte Carlo simulations in the ballistic and quasi-ballistic regimes

Author's Department

Electronics & Communications Engineering Department

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Document Type

Research Article

Publication Title

IEEE Transactions on Electron Devices

Publication Date

6-1-2015

doi

10.1109/TED.2015.2420580

First Page

1796

Last Page

1802

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