Testing of one stage pipelined analog to digital converter
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
12-1-2011
Document Type
Book Chapter
Book Title
Proceedings - ICCES'2011: 2011 International Conference on Computer Engineering and Systems
ISBN
SCOPUS_ID:84857188997
Publisher
IEEE
City
Cairo, Egypt
First Page
193
Last Page
198
Keywords
catastrophic faults, fault model, mixed-signal testing, PADC, pipelined analog to digital converter, test coverage
Recommended Citation
APA Citation
Hamed, S.
Khalil, A.
Amer, H.
Abdelhalim, M.
&
Madian, A.
(2011). Testing of one stage pipelined analog to digital converter. Proceedings - ICCES'2011: 2011 International Conference on Computer Engineering and Systems (pp. 193-198). IEEE.
MLA Citation
Hamed, Sahar M., et al.
"Testing of one stage pipelined analog to digital converter." Proceedings - ICCES'2011: 2011 International Conference on Computer Engineering and Systems, IEEE, 2011. pp. 193-198