Testing of one stage pipelined analog to digital converter
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
12-1-2011
Document Type
Book Chapter
Book Title
Proceedings - ICCES'2011: 2011 International Conference on Computer Engineering and Systems
ISBN
SCOPUS_ID:84857188997
Publisher
IEEE
City
Cairo, Egypt
First Page
193
Last Page
198
Keywords
catastrophic faults, fault model, mixed-signal testing, PADC, pipelined analog to digital converter, test coverage
Recommended Citation
APA Citation
Hamed, S.
Khalil, A.
Amer, H.
Abdelhalim, M.
&
Madian, A.
(2011).Testing of one stage pipelined analog to digital converter. IEEE. , 193-198
https://fount.aucegypt.edu/faculty_book_chapters/696
MLA Citation
Hamed, Sahar M., et al.
Testing of one stage pipelined analog to digital converter. IEEE, 2011.pp. 193-198
https://fount.aucegypt.edu/faculty_book_chapters/696