Testing of one stage pipelined analog to digital converter

Authors

Sahar M. Hamed, Cairo University, Faculty of Engineering
Ahmed H. Khalil, Cairo University, Faculty of Engineering
Hassanein H. Amer, American University in CairoFollow
M. B. Abdelhalim, Arab Academy for Science, Technology and Maritime Transport
Ahmed H. Madian, Atomic Energy Authority of Egypt

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-1-2011

Document Type

Book Chapter

Book Title

Proceedings - ICCES'2011: 2011 International Conference on Computer Engineering and Systems

ISBN

SCOPUS_ID:84857188997

Publisher

IEEE

City

Cairo, Egypt

First Page

193

Last Page

198

Keywords

catastrophic faults, fault model, mixed-signal testing, PADC, pipelined analog to digital converter, test coverage

Recommended Citation

APA Citation

Hamed, S. Khalil, A. Amer, H. Abdelhalim, M. & Madian, A. (2011).Testing of one stage pipelined analog to digital converter. IEEE. , 193-198
https://fount.aucegypt.edu/faculty_book_chapters/696

MLA Citation

Hamed, Sahar M., et al. Testing of one stage pipelined analog to digital converter. IEEE, 2011.pp. 193-198
https://fount.aucegypt.edu/faculty_book_chapters/696