Low cost test for catastrophic faults in CMOS operational transcondutor

Authors

Mahmoud M. Fouad, Cairo University, Faculty of Engineering
Hassanein H. Amer, American University in CairoFollow
Ahmed H. Madian, Atomic Energy Authority of Egypt
M. B. Abdelhalim, Arab Academy for Science, Technology and Maritime Transport

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-1-2011

Document Type

Book Chapter

Book Title

Proceedings of the International Conference on Microelectronics, ICM

ISBN

SCOPUS_ID:84860699446

Publisher

IEEE

City

Hammamet, Tunisia

First Page

1

Last Page

5

Keywords

Analog Testing, CMOS, fault model, minimum test, Transcondcutor

Recommended Citation

APA Citation

Fouad, M. Amer, H. Madian, A. & Abdelhalim, M. (2011). Low cost test for catastrophic faults in CMOS operational transcondutor. Proceedings of the International Conference on Microelectronics, ICM (pp. 1-5). IEEE.

MLA Citation

Fouad, Mahmoud M., et al. "Low cost test for catastrophic faults in CMOS operational transcondutor." Proceedings of the International Conference on Microelectronics, ICM, IEEE, 2011. pp. 1-5