Low cost test for catastrophic faults in CMOS operational transcondutor

Low cost test for catastrophic faults in CMOS operational transcondutor

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-1-2011

Document Type

Book Chapter

Book Title

Proceedings of the International Conference on Microelectronics, ICM

ISBN

SCOPUS_ID:84860699446

Publisher

IEEE

City

Hammamet, Tunisia

First Page

1

Last Page

5

Keywords

Analog Testing, CMOS, fault model, minimum test, Transcondcutor

Low cost test for catastrophic faults in CMOS operational transcondutor

Share

COinS