Low cost test for catastrophic faults in CMOS operational transcondutor
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
12-1-2011
Document Type
Book Chapter
Book Title
Proceedings of the International Conference on Microelectronics, ICM
ISBN
SCOPUS_ID:84860699446
Publisher
IEEE
City
Hammamet, Tunisia
First Page
1
Last Page
5
Keywords
Analog Testing, CMOS, fault model, minimum test, Transcondcutor
Recommended Citation
APA Citation
Fouad, M.
Amer, H.
Madian, A.
&
Abdelhalim, M.
(2011).Low cost test for catastrophic faults in CMOS operational transcondutor. IEEE. , 1-5
https://fount.aucegypt.edu/faculty_book_chapters/695
MLA Citation
Fouad, Mahmoud M., et al.
Low cost test for catastrophic faults in CMOS operational transcondutor. IEEE, 2011.pp. 1-5
https://fount.aucegypt.edu/faculty_book_chapters/695