D2. testing of 1.5 bit per stage pipelined analog to digital converter: 5 bits case study
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
1-1-2013
Document Type
Book Chapter
Book Title
National Radio Science Conference, NRSC, Proceedings
ISBN
SCOPUS_ID:84982735892
Publisher
IEEE
City
Cairo, Egypt
First Page
439
Last Page
447
Keywords
1.5 bit/stage, Catastrophic faults, PADC, Structural testing
Recommended Citation
APA Citation
Hamed, S.
Khalil, A.
Abdelhalim, M.
Amer, H.
&
Madian, A.
(2013).D2. testing of 1.5 bit per stage pipelined analog to digital converter: 5 bits case study. IEEE. , 439-447
https://fount.aucegypt.edu/faculty_book_chapters/610
MLA Citation
Hamed, Sahar M., et al.
D2. testing of 1.5 bit per stage pipelined analog to digital converter: 5 bits case study. IEEE, 2013.pp. 439-447
https://fount.aucegypt.edu/faculty_book_chapters/610