Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
9-18-2013
Document Type
Book Chapter
Book Title
2013 3rd International Conference on Communications and Information Technology, ICCIT 2013
ISBN
SCOPUS_ID:84883857648
Publisher
IEEE
City
Beirut, Lebanon
First Page
366
Last Page
370
Keywords
1.5 bit per stage, PADC, Sliding Window Technique, Test Input Regeneration
Recommended Citation
APA Citation
Hamed, S.
Khalil, A.
Abdelhalim, M.
Amer, H.
&
Madian, A.
(2013).Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques. IEEE. , 366-370
https://fount.aucegypt.edu/faculty_book_chapters/559
MLA Citation
Hamed, Sahar M., et al.
Testing of N-stage pipelined ADC using test input regeneration and sliding window techniques. IEEE, 2013.pp. 366-370
https://fount.aucegypt.edu/faculty_book_chapters/559