Coupling capacitance extraction in through-silicon via (TSV) arrays

Coupling capacitance extraction in through-silicon via (TSV) arrays

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Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

3-23-2016

Document Type

Book Chapter

Book Title

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

ISBN

SCOPUS_ID:84964870250

Publisher

IEEE

City

Cairo, Egypt

First Page

470

Last Page

473

Keywords

2.5D-IC, 3D-IC, SiP, TSV

Coupling capacitance extraction in through-silicon via (TSV) arrays

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