Coupling capacitance extraction in through-silicon via (TSV) arrays
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
3-23-2016
Document Type
Book Chapter
Book Title
Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
ISBN
SCOPUS_ID:84964870250
Publisher
IEEE
City
Cairo, Egypt
First Page
470
Last Page
473
Keywords
2.5D-IC, 3D-IC, SiP, TSV
Recommended Citation
APA Citation
Ramadan, T.
Yahya, E.
Dessouky, M.
&
Ismail, Y.
(2016).Coupling capacitance extraction in through-silicon via (TSV) arrays. IEEE. , 470-473
https://fount.aucegypt.edu/faculty_book_chapters/371
MLA Citation
Ramadan, Tarek, et al.
Coupling capacitance extraction in through-silicon via (TSV) arrays. IEEE, 2016.pp. 470-473
https://fount.aucegypt.edu/faculty_book_chapters/371