High coverage test for the second generation current conveyor
Electronics & Communications Engineering Department
[abstract not available]
Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
catastrophic faults, fault coverage, fault model, production testing, Second generation current conveyors
(2016).High coverage test for the second generation current conveyor. IEEE. , 429-432
Emara, A. S., et al.
High coverage test for the second generation current conveyor. IEEE, 2016.pp. 429-432