High coverage test for the second generation current conveyor

Chapter Title

High coverage test for the second generation current conveyor

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

3-23-2016

Document Type

Book Chapter

Book Title

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

ISBN

SCOPUS_ID:84964827303

Publisher

IEEE

City

Cairo, Egypt

First Page

429

Last Page

432

Keywords

catastrophic faults, fault coverage, fault model, production testing, Second generation current conveyors

High coverage test for the second generation current conveyor

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