High coverage test for the second generation current conveyor
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
3-23-2016
Document Type
Book Chapter
Book Title
Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
ISBN
SCOPUS_ID:84964827303
Publisher
IEEE
City
Cairo, Egypt
First Page
429
Last Page
432
Keywords
catastrophic faults, fault coverage, fault model, production testing, Second generation current conveyors
Recommended Citation
APA Citation
Emara, A.
Madian, A.
Amer, H.
&
Amer, S.
(2016).High coverage test for the second generation current conveyor. IEEE. , 429-432
https://fount.aucegypt.edu/faculty_book_chapters/367
MLA Citation
Emara, A. S., et al.
High coverage test for the second generation current conveyor. IEEE, 2016.pp. 429-432
https://fount.aucegypt.edu/faculty_book_chapters/367