X-ray diffraction studies of amorphous silicon
Date of Award
Online Submission Date
70 leaves :
Library of Congress Subject Heading 1
Library of Congress Subject Heading 2
The author retains all rights with regard to copyright. The author certifies that written permission from the owner(s) of third-party copyrighted matter included in the thesis, dissertation, paper, or record of study has been obtained. The author further certifies that IRB approval has been obtained for this thesis, or that IRB approval is not necessary for this thesis. Insofar as this thesis, dissertation, paper, or record of study is an educational record as defined in the Family Educational Rights and Privacy Act (FERPA) (20 USC 1232g), the author has granted consent to disclosure of it to anyone who requests a copy.
(1984).X-ray diffraction studies of amorphous silicon [Master’s thesis, the American University in Cairo]. AUC Knowledge Fountain.
Gouda, Adel Gabra I. X-ray diffraction studies of amorphous silicon. 1984. American University in Cairo, Master's thesis. AUC Knowledge Fountain.