School
School of Sciences and Engineering
Degree Name
MS in Solid State Science
Date of Award
7-1-1984
Online Submission Date
7-1-1984
First Advisor
Dr. Wahby Wadie
Second Advisor
Dr. Hosny Omar
Third Advisor
Dr. P. Askalani
Document Type
Thesis
Extent
76 leaves
Library of Congress Subject Heading 1
X-rays
Library of Congress Subject Heading 2
Silicons.
Rights
The American University in Cairo grants authors of theses and dissertations a maximum embargo period of two years from the date of submission, upon request. After the embargo elapses, these documents are made available publicly. If you are the author of this thesis or dissertation, and would like to request an exceptional extension of the embargo period, please write to thesisadmin@aucegypt.edu
Recommended Citation
APA Citation
Gouda, A.
(1984).X-ray diffraction studies of amorphous silicon [Thesis, the American University in Cairo]. AUC Knowledge Fountain.
https://fount.aucegypt.edu/retro_etds/595
MLA Citation
Gouda, Adel Gabra I. X-ray diffraction studies of amorphous silicon. 1984. American University in Cairo, Thesis. AUC Knowledge Fountain.
https://fount.aucegypt.edu/retro_etds/595
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License
Call Number
Thesis 1984/624
Location
mgfth