School
School of Sciences and Engineering
Degree Name
MS in Solid State Science
Date of Award
5-1-1983
Online Submission Date
5-1-1983
First Advisor
Dr. P Askalani
Second Advisor
Dr. Wahby Wadia
Third Advisor
Dr. G Habashy
Document Type
Thesis
Extent
65 leaves
Library of Congress Subject Heading 1
X-rays
Library of Congress Subject Heading 2
Silicon
Rights
The American University in Cairo grants authors of theses and dissertations a maximum embargo period of two years from the date of submission, upon request. After the embargo elapses, these documents are made available publicly. If you are the author of this thesis or dissertation, and would like to request an exceptional extension of the embargo period, please write to thesisadmin@aucegypt.edu
Recommended Citation
APA Citation
Aly, E.
(1983).Bonding effects on x-ray diffraction intensities in amorphous silicon [Thesis, the American University in Cairo]. AUC Knowledge Fountain.
https://fount.aucegypt.edu/retro_etds/544
MLA Citation
Aly, Essam El Din E. Bonding effects on x-ray diffraction intensities in amorphous silicon. 1983. American University in Cairo, Thesis. AUC Knowledge Fountain.
https://fount.aucegypt.edu/retro_etds/544
Creative Commons License
This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License
Call Number
Thesis 1983/587
Location
mgfth