Parametric DFM solution for analog circuits: Electrical-driven hotspot detection, analysis, and correction flow

Authors

Haitham Eissa, Mentor Graphics Corporation
Rami Fathy Salem, Mentor Graphics Corporation
Ahmed Arafa, Mentor Graphics Corporation
Sherif Hany, Mentor Graphics Corporation
Abdelrahman El-Mously, Mentor Graphics Corporation
Mohamed Dessouky, Mentor Graphics Corporation
David Nairn, University of Waterloo
Mohab Anis, American University in CairoFollow

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TVLSI.2012.2201759

Document Type

Research Article

Publication Title

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Publication Date

1-1-2013

doi

10.1109/TVLSI.2012.2201759

First Page

807

Last Page

820

Recommended Citation

APA Citation

Eissa, H. Salem, R. Arafa, A. Hany, S. ... (2013). Parametric DFM solution for analog circuits: Electrical-driven hotspot detection, analysis, and correction flow. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 21(5), 807–820. 10.1109/TVLSI.2012.2201759
https://fount.aucegypt.edu/faculty_journal_articles/2057

MLA Citation

Eissa, Haitham, et al. "Parametric DFM solution for analog circuits: Electrical-driven hotspot detection, analysis, and correction flow." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 21,no. 5, 2013, pp. 807–820.
https://fount.aucegypt.edu/faculty_journal_articles/2057