Catastrophic short and open fault detection in mos current mode circuits: A case study
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
12-1-2010
Document Type
Book Chapter
Book Title
BEC 2010 - 2010 12th Biennial Baltic Electronics Conference, Proceedings of the 12th Biennial Baltic Electronics Conference
ISBN
SCOPUS_ID:79952155366
Publisher
IEEE
City
Tallinn, Estonia
First Page
145
Last Page
148
Recommended Citation
APA Citation
Madian, A.
Amer, H.
&
Eldesouky, A.
(2010). Catastrophic short and open fault detection in mos current mode circuits: A case study. BEC 2010 - 2010 12th Biennial Baltic Electronics Conference, Proceedings of the 12th Biennial Baltic Electronics Conference (pp. 145-148). IEEE.
MLA Citation
Madian, Ahmed H., et al.
"Catastrophic short and open fault detection in mos current mode circuits: A case study." BEC 2010 - 2010 12th Biennial Baltic Electronics Conference, Proceedings of the 12th Biennial Baltic Electronics Conference, IEEE, 2010. pp. 145-148