Refractive index change in porous silicon after detaching from the substrate

Chapter Title

Refractive index change in porous silicon after detaching from the substrate

Files

Department

Physics Department

Description

[abstract not available]

Publication Date

12-1-2010

Document Type

Book Chapter

Book Title

2010 OSA-IEEE-COS Advances in Optoelectronics and Micro/Nano-Optics, AOM 2010

ISBN

SCOPUS_ID:79952838789

Publisher

IEEE

City

Guangzhou, China

First Page

1

Last Page

5

Keywords

Annealing, Bragg reflectors, Porous silicon, Porous silicon oxidation, sress, Refractive index, Silicon electrochemical etching, Strain

Refractive index change in porous silicon after detaching from the substrate

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