Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
12-1-2010
Document Type
Book Chapter
Book Title
IDT'10 - 2010 5th International Design and Test Workshop, Proceedings
ISBN
SCOPUS_ID:79953073048
Publisher
IEEE
City
Abu Dhabi, United Arab Emirates
First Page
117
Last Page
121
Keywords
CMOS, GA, Genetic algorithm, Leakage current, Test vectors, Total dose, Worst-case
Recommended Citation
APA Citation
Abdel-Aziz, H.
Abdel-Aziz, M.
Wassal, A.
&
Abou-Auf, A.
(2010).Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures. IEEE. , 117-121
https://fount.aucegypt.edu/faculty_book_chapters/730
MLA Citation
Abdel-Aziz, H. A., et al.
Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures. IEEE, 2010.pp. 117-121
https://fount.aucegypt.edu/faculty_book_chapters/730