Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures

Authors

H. A. Abdel-Aziz, American University in Cairo
M. M. Abdel-Aziz, American University in Cairo
A. G. Wassal, American University in Cairo
A. A. Abou-Auf, American University in CairoFollow

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-1-2010

Document Type

Book Chapter

Book Title

IDT'10 - 2010 5th International Design and Test Workshop, Proceedings

ISBN

SCOPUS_ID:79953073048

Publisher

IEEE

City

Abu Dhabi, United Arab Emirates

First Page

117

Last Page

121

Keywords

CMOS, GA, Genetic algorithm, Leakage current, Test vectors, Total dose, Worst-case

Recommended Citation

APA Citation

Abdel-Aziz, H. Abdel-Aziz, M. Wassal, A. & Abou-Auf, A. (2010). Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures. IDT'10 - 2010 5th International Design and Test Workshop, Proceedings (pp. 117-121). IEEE.

MLA Citation

Abdel-Aziz, H. A., et al. "Worst-case test vectors generation using genetic algorithms for the detection of total-dose induced leakage current failures." IDT'10 - 2010 5th International Design and Test Workshop, Proceedings, IEEE, 2010. pp. 117-121