A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations

Authors

Mohamed Rabie, American University in Cairo
Ahmed Bahgat, King Abdullah University of Science and Technology
Khaled Ramadan, King Abdullah University of Science and Technology
Hosam Shobak, American University in Cairo
Tarek Nasr, King Abdullah University of Science and Technology

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

12-1-2011

Document Type

Book Chapter

Book Title

2011 International Conference on Energy Aware Computing, ICEAC 2011

ISBN

SCOPUS_ID:84856876331

Publisher

IEEE

City

Istanbul, Turkey

First Page

1

Last Page

4

Keywords

Independent-Gate FinFET, MOSFET, Process Variations, Semi-Dynamic Flip-Flop, Tied-Gate FinFET

Recommended Citation

APA Citation

Rabie, M. Bahgat, A. Ramadan, K. Shobak, H. & Nasr, T. (2011).A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. IEEE. , 1-4
https://fount.aucegypt.edu/faculty_book_chapters/686

MLA Citation

Rabie, Mohamed, et al. A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. IEEE, 2011.pp. 1-4
https://fount.aucegypt.edu/faculty_book_chapters/686