A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations

A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations

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Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-1-2011

Document Type

Book Chapter

Book Title

2011 International Conference on Energy Aware Computing, ICEAC 2011

ISBN

SCOPUS_ID:84856876331

Publisher

IEEE

City

Istanbul, Turkey

First Page

1

Last Page

4

Keywords

Independent-Gate FinFET, MOSFET, Process Variations, Semi-Dynamic Flip-Flop, Tied-Gate FinFET

A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations

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