A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
12-1-2011
Document Type
Book Chapter
Book Title
2011 International Conference on Energy Aware Computing, ICEAC 2011
ISBN
SCOPUS_ID:84856876331
Publisher
IEEE
City
Istanbul, Turkey
First Page
1
Last Page
4
Keywords
Independent-Gate FinFET, MOSFET, Process Variations, Semi-Dynamic Flip-Flop, Tied-Gate FinFET
Recommended Citation
APA Citation
Rabie, M.
Bahgat, A.
Ramadan, K.
Shobak, H.
&
Nasr, T.
(2011).A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. IEEE. , 1-4
https://fount.aucegypt.edu/faculty_book_chapters/686
MLA Citation
Rabie, Mohamed, et al.
A comparative analysis between FinFET Semi-Dynamic Flip-Flop topologies under process variations. IEEE, 2011.pp. 1-4
https://fount.aucegypt.edu/faculty_book_chapters/686