Worst-case test vectors of sequential ASiCS exposed to total dose
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
12-1-2011
Document Type
Book Chapter
Book Title
Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
ISBN
SCOPUS_ID:84860160182
Publisher
IEEE
City
Seville, Spain
First Page
175
Last Page
181
Recommended Citation
APA Citation
Abou-Auf, A.
Abdel-Aziz, M.
Abdel-Aziz, H.
&
Wassal, A.
(2011).Worst-case test vectors of sequential ASiCS exposed to total dose. IEEE. , 175-181
https://fount.aucegypt.edu/faculty_book_chapters/683
MLA Citation
Abou-Auf, Ahmed A., et al.
Worst-case test vectors of sequential ASiCS exposed to total dose. IEEE, 2011.pp. 175-181
https://fount.aucegypt.edu/faculty_book_chapters/683