A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
12-28-2011
Document Type
Book Chapter
Book Title
International System on Chip Conference
ISBN
SCOPUS_ID:84255200986
Publisher
IEEE
City
Taipei, Taiwan
First Page
231
Last Page
236
Keywords
design for manufacturing, Design-For-Manufacturability, DFM, e-DFM, e-hotspot, Electrical Design For Manufacturability, electrical design for manufacturing, Lithography variations, Parametric Yield, Process variations, Stress effects
Recommended Citation
APA Citation
Salem, R.
Arafa, A.
Hany, S.
Elmously, A.
&
Eissa, H.
(2011).A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. IEEE. , 231-236
https://fount.aucegypt.edu/faculty_book_chapters/666
MLA Citation
Salem, Rami F., et al.
A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. IEEE, 2011.pp. 231-236
https://fount.aucegypt.edu/faculty_book_chapters/666