A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow

Authors

Rami F. Salem, Mentor Graphics Corporation
Ahmed Arafa, Mentor Graphics Corporation
Sherif Hany, Mentor Graphics Corporation
Abdelrahman Elmously, Mentor Graphics Corporation
Haitham Eissa, Mentor Graphics Corporation

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-28-2011

Document Type

Book Chapter

Book Title

International System on Chip Conference

ISBN

SCOPUS_ID:84255200986

Publisher

IEEE

City

Taipei, Taiwan

First Page

231

Last Page

236

Keywords

design for manufacturing, Design-For-Manufacturability, DFM, e-DFM, e-hotspot, Electrical Design For Manufacturability, electrical design for manufacturing, Lithography variations, Parametric Yield, Process variations, Stress effects

Recommended Citation

APA Citation

Salem, R. Arafa, A. Hany, S. Elmously, A. & Eissa, H. (2011). A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow. International System on Chip Conference (pp. 231-236). IEEE.

MLA Citation

Salem, Rami F., et al. "A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow." International System on Chip Conference, IEEE, 2011. pp. 231-236