High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
7-16-2012
Document Type
Book Chapter
Book Title
Proceedings - International Symposium on Quality Electronic Design, ISQED
ISBN
SCOPUS_ID:84863640286
Publisher
IEEE
City
Santa Clara, CA, USA
First Page
223
Last Page
227
Keywords
Design-For-Manufacturability (DFM), Electrical Design-For-Manufacturability (e-DFM), Hot spots, Lithography variations, Parametric Yield, Process variations, Stress effects
Recommended Citation
APA Citation
Salem, R.
Al-Imam, M.
ElMously, A.
Eissa, H.
&
Arafa, A.
(2012).High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. IEEE. , 223-227
https://fount.aucegypt.edu/faculty_book_chapters/650
MLA Citation
Salem, Rami F., et al.
High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. IEEE, 2012.pp. 223-227
https://fount.aucegypt.edu/faculty_book_chapters/650