High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique

Authors

Rami F. Salem, Mentor Graphics Corporation
Mohamed Al-Imam, Mentor Graphics Corporation
Abdelrahman ElMously, Mentor Graphics Corporation
Haitham Eissa, Mentor Graphics Corporation
Ahmed Arafa, Mentor Graphics Corporation

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

7-16-2012

Document Type

Book Chapter

Book Title

Proceedings - International Symposium on Quality Electronic Design, ISQED

ISBN

SCOPUS_ID:84863640286

Publisher

IEEE

City

Santa Clara, CA, USA

First Page

223

Last Page

227

Keywords

Design-For-Manufacturability (DFM), Electrical Design-For-Manufacturability (e-DFM), Hot spots, Lithography variations, Parametric Yield, Process variations, Stress effects

Recommended Citation

APA Citation

Salem, R. Al-Imam, M. ElMously, A. Eissa, H. & Arafa, A. (2012).High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. IEEE. , 223-227
https://fount.aucegypt.edu/faculty_book_chapters/650

MLA Citation

Salem, Rami F., et al. High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique. IEEE, 2012.pp. 223-227
https://fount.aucegypt.edu/faculty_book_chapters/650