Particle swarm optimization for the identification of worst case test vectors of total-dose induced leakage current failures in ASICs

Authors

M. M. Abdel-Aziz, American University in Cairo
H. A. Abdel-Aziz, American University in Cairo
A. A. Abou-Auf, American University in CairoFollow
A. G. Wassal, Cairo University

Files

Department

Electronics & Communications Engineering Department

Abstract

[abstract not available]

Publication Date

12-1-2012

Document Type

Book Chapter

Book Title

Proceedings of the International Conference on Microelectronics, ICM

ISBN

SCOPUS_ID:84875622677

Publisher

IEEE

City

Algiers, Algeria

First Page

267

Last Page

270

Keywords

CMOS, leakage current, Particle Swarm Optimization, PSO, test vectors, total dose, worst-case

Recommended Citation

APA Citation

Abdel-Aziz, M. Abdel-Aziz, H. Abou-Auf, A. & Wassal, A. (2012). Particle swarm optimization for the identification of worst case test vectors of total-dose induced leakage current failures in ASICs. Proceedings of the International Conference on Microelectronics, ICM (pp. 267-270). IEEE.

MLA Citation

Abdel-Aziz, M. M., et al. "Particle swarm optimization for the identification of worst case test vectors of total-dose induced leakage current failures in ASICs." Proceedings of the International Conference on Microelectronics, ICM, IEEE, 2012. pp. 267-270