Testing current mode two-input logic gates

Chapter Title

Testing current mode two-input logic gates

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

1-1-2014

Document Type

Book Chapter

Book Title

Canadian Conference on Electrical and Computer Engineering

ISBN

SCOPUS_ID:84908440122

Publisher

IEEE

City

Toronto, ON, Canada

First Page

1

Last Page

6

Keywords

current mode, fault model, stuck-at, testing

Testing current mode two-input logic gates

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