Performance evaluation of finFET based SRAM under statistical VT variability

Chapter Title

Performance evaluation of finFET based SRAM under statistical VT variability

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Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

1-1-2014

Document Type

Book Chapter

Book Title

Proceedings of the International Conference on Microelectronics, ICM

ISBN

SCOPUS_ID:84988246925

Publisher

IEEE

City

Doha, Qatar

First Page

88

Last Page

91

Keywords

6T SRAM, Nano-scale FinFET, Technology scaling, threshold voltage variations

Performance evaluation of finFET based SRAM under statistical VT variability

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