Performance evaluation of finFET based SRAM under statistical VT variability
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
1-1-2014
Document Type
Book Chapter
Book Title
Proceedings of the International Conference on Microelectronics, ICM
ISBN
SCOPUS_ID:84988246925
Publisher
IEEE
City
Doha, Qatar
First Page
88
Last Page
91
Keywords
6T SRAM, Nano-scale FinFET, Technology scaling, threshold voltage variations
Recommended Citation
APA Citation
El-Thakeb, A.
Elhamid, H.
Mostafa, H.
&
Ismail, Y.
(2014). Performance evaluation of finFET based SRAM under statistical VT variability. Proceedings of the International Conference on Microelectronics, ICM (pp. 88-91). IEEE.
MLA Citation
El-Thakeb, Ahmed T., et al.
"Performance evaluation of finFET based SRAM under statistical VT variability." Proceedings of the International Conference on Microelectronics, ICM, IEEE, 2014. pp. 88-91