Performance evaluation of finFET based SRAM under statistical VT variability
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
1-1-2014
Document Type
Book Chapter
Book Title
Proceedings of the International Conference on Microelectronics, ICM
ISBN
SCOPUS_ID:84988246925
Publisher
IEEE
City
Doha, Qatar
First Page
88
Last Page
91
Keywords
6T SRAM, Nano-scale FinFET, Technology scaling, threshold voltage variations
Recommended Citation
APA Citation
El-Thakeb, A.
Elhamid, H.
Mostafa, H.
&
Ismail, Y.
(2014).Performance evaluation of finFET based SRAM under statistical VT variability. IEEE. , 88-91
https://fount.aucegypt.edu/faculty_book_chapters/500
MLA Citation
El-Thakeb, Ahmed T., et al.
Performance evaluation of finFET based SRAM under statistical VT variability. IEEE, 2014.pp. 88-91
https://fount.aucegypt.edu/faculty_book_chapters/500