Effect of the resistance of open and short faults on the production testing of MCML gates
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
11-4-2014
Document Type
Book Chapter
Book Title
Proceedings of the Biennial Baltic Electronics Conference, BEC
ISBN
SCOPUS_ID:84971254290
Publisher
IEEE
City
Tallinn, Estonia
First Page
81
Last Page
84
Keywords
CMOS, current mode, fault model, testing
Recommended Citation
APA Citation
Mohie El-Din, R.
Emara, A.
Amer, S.
Fouad, M.
&
Madian, A.
(2014). Effect of the resistance of open and short faults on the production testing of MCML gates. Proceedings of the Biennial Baltic Electronics Conference, BEC (pp. 81-84). IEEE.
MLA Citation
Mohie El-Din, R., et al.
"Effect of the resistance of open and short faults on the production testing of MCML gates." Proceedings of the Biennial Baltic Electronics Conference, BEC, IEEE, 2014. pp. 81-84