Modeling and analysis of scattering from silicon nanoparticles with high excess carriers for MIR spectroscopy
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
1-1-2017
Document Type
Book Chapter
Book Title
Proceedings of SPIE - The International Society for Optical Engineering
ISBN
SCOPUS_ID:85019081901
Publisher
SPIE
City
San Francisco, CA
First Page
1
Last Page
7
Keywords
Mid infrared, Mie theory, plasmonic particles, Scattering cross-section
Recommended Citation
APA Citation
Shoer, I.
Nageeb, A.
Osman, A.
Mekawey, H.
&
Ismail, Y.
(2017).Modeling and analysis of scattering from silicon nanoparticles with high excess carriers for MIR spectroscopy. SPIE. , 1-7
https://fount.aucegypt.edu/faculty_book_chapters/289
MLA Citation
Shoer, Ibrahim, et al.
Modeling and analysis of scattering from silicon nanoparticles with high excess carriers for MIR spectroscopy. SPIE, 2017.pp. 1-7
https://fount.aucegypt.edu/faculty_book_chapters/289