A low power self-healing resilient microarchitecture for PVT variability mitigation
Files
Department
Electronics & Communications Engineering Department
Abstract
[abstract not available]
Publication Date
6-1-2018
Document Type
Book Chapter
Book Title
IEEE Transactions on Circuits and Systems I: Regular Papers
ISBN
SCOPUS_ID:85037654083
Publisher
IEEE
City
Piscataway, New Jersey
First Page
1909
Last Page
1918
Keywords
Error detection, Error recovery, Low power, MAC unit, Pipeline recovery, Process voltage temperature (PVT) variations, Resilient microarchitecture, Self-healing architecture
Recommended Citation
APA Citation
Agwa, S.
Yahya, E.
&
Ismail, Y.
(2018).A low power self-healing resilient microarchitecture for PVT variability mitigation. IEEE. , 1909-1918
https://fount.aucegypt.edu/faculty_book_chapters/211
MLA Citation
Agwa, Shady, et al.
A low power self-healing resilient microarchitecture for PVT variability mitigation. IEEE, 2018.pp. 1909-1918
https://fount.aucegypt.edu/faculty_book_chapters/211