Title

Fault Modeling and Worst Case Test Vector Generation for Flash-Based FPGAs Exposed to Total Dose

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2017.2687982

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

8-1-2017

doi

10.1109/TNS.2017.2687982

First Page

2250

Last Page

2258

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