Title

Worst Case Test Vectors for Sequential Circuits in Flash-Based FPGAs Exposed to Total Dose

Funding Sponsor

American University in Cairo

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2019.2920449

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

7-1-2019

doi

10.1109/TNS.2019.2920449

First Page

1642

Last Page

1650

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