Performance Analysis of Deep Sub micron VLSI Circuits in the Presence of Self and Mutual

Authors

Yehea Ismail, The American University in Cairo (AUC)Follow

Author's Department

Electronics & Communications Engineering Department

Find in your Library

http://www.worldcat.org/oclc/108453610

All Authors

M Chowdhury; Y Ismail; C Kashyap; B Krauter

Document Type

Research Article

Publication Title

IEEE International Symposium on Circuits and Systems

Publication Date

2-1-2002

doi

10.1109/ISCAS.2002.1010423

Abstract

This paper illustrates the growing significance of self and mutual inductances by examining their effects on performance and characteristic issues like propagation delay, rise time, and overshoots. This paper introduces Elmore-like closed form solutions to analyze the behavior of integrated circuits in the presence of self and mutual inductances. The complexity of the expressions introduced here is linear with the number of elements in the interconnect network, and has Elmore delay accuracy characteristics. The propagation delay and overshoots estimated based on these formulae are within 15% of AS/X simulations for a wide range of interconnects from IBM's most recent CMOS technology.

First Page

1

Last Page

5

Recommended Citation

APA Citation

Ismail, Y. (2002). Performance Analysis of Deep Sub micron VLSI Circuits in the Presence of Self and Mutual. IEEE International Symposium on Circuits and Systems, 4, 1–5. 10.1109/ISCAS.2002.1010423
https://fount.aucegypt.edu/faculty_journal_articles/344

MLA Citation

Ismail, Yehea "Performance Analysis of Deep Sub micron VLSI Circuits in the Presence of Self and Mutual." IEEE International Symposium on Circuits and Systems, vol. 4, 2002, pp. 1–5.
https://fount.aucegypt.edu/faculty_journal_articles/344