Title

Fault modeling and worst-case test vectors of sequential ASICs exposed to total dose

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2012.2204900

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

8-7-2012

doi

10.1109/TNS.2012.2204900

First Page

829

Last Page

837

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