Fault modeling and worst-case test vectors of sequential ASICs exposed to total dose

Authors

Ahmed A. Abou-Auf, American University in CairoFollow
Mostafa M. Abdel-Aziz, American University in Cairo
Hamzah A. Abdel-Aziz, American University in Cairo
Amr G. Wassal, Cairo University

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2012.2204900

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

8-7-2012

doi

10.1109/TNS.2012.2204900

First Page

829

Last Page

837

Recommended Citation

APA Citation

Abou-Auf, A. Abdel-Aziz, M. Abdel-Aziz, H. & Wassal, A. (2012). Fault modeling and worst-case test vectors of sequential ASICs exposed to total dose. IEEE Transactions on Nuclear Science, 59(4 PART 1), 829–837. 10.1109/TNS.2012.2204900
https://fount.aucegypt.edu/faculty_journal_articles/2120

MLA Citation

Abou-Auf, Ahmed A., et al. "Fault modeling and worst-case test vectors of sequential ASICs exposed to total dose." IEEE Transactions on Nuclear Science, vol. 59,no. 4 PART 1, 2012, pp. 829–837.
https://fount.aucegypt.edu/faculty_journal_articles/2120