Title

Fault modeling and worst-case test vectors for delay failures induced by total dose in ASICs

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2012.2224376

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

12-26-2012

doi

10.1109/TNS.2012.2224376

First Page

2930

Last Page

2935

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