Fault modeling and worst-case test vectors for delay failures induced by total dose in ASICs

Authors

Ahmed A. Abou-Auf, American University in CairoFollow
Mostafa M. Abdel-Aziz, American University in Cairo
Hamzah A. Abdel-Aziz, American University in Cairo
Amr G. Wassal, Cairo University
Ihab E. Talkhan, Cairo University

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/TNS.2012.2224376

Document Type

Research Article

Publication Title

IEEE Transactions on Nuclear Science

Publication Date

12-26-2012

doi

10.1109/TNS.2012.2224376

First Page

2930

Last Page

2935

Recommended Citation

APA Citation

Abou-Auf, A. Abdel-Aziz, M. Abdel-Aziz, H. Wassal, A. & Talkhan, I. (2012). Fault modeling and worst-case test vectors for delay failures induced by total dose in ASICs. IEEE Transactions on Nuclear Science, 59(6), 2930–2935. 10.1109/TNS.2012.2224376
https://fount.aucegypt.edu/faculty_journal_articles/2074

MLA Citation

Abou-Auf, Ahmed A., et al. "Fault modeling and worst-case test vectors for delay failures induced by total dose in ASICs." IEEE Transactions on Nuclear Science, vol. 59,no. 6, 2012, pp. 2930–2935.
https://fount.aucegypt.edu/faculty_journal_articles/2074