Influence of precursor thin films stacking order on the properties of Cu₂ZnSnS₄ thin films fabricated by electrochemical deposition method

Authors

E. M. Mkawi, Universiti Sains Malaysia
K. Ibrahim, Universiti Sains Malaysia
M. K.M. Ali, Universiti Sains Malaysia
M. A. Farrukh, University of the Punjab, Lahore
Nageh K. Allam, American University in CairoFollow

Funding Number

203/PSF-6721001

Funding Sponsor

Hospital Universiti Sains Malaysia

Author's Department

Physics Department

Find in your Library

https://doi.org/10.1016/j.spmi.2014.10.022

Document Type

Research Article

Publication Title

Superlattices and Microstructures

Publication Date

1-1-2014

doi

10.1016/j.spmi.2014.10.022

First Page

339

Last Page

348

Recommended Citation

APA Citation

Mkawi, E. Ibrahim, K. Ali, M. Farrukh, M. & Allam, N. K. (2014). Influence of precursor thin films stacking order on the properties of Cu₂ZnSnS₄ thin films fabricated by electrochemical deposition method. Superlattices and Microstructures, 76, 339–348. 10.1016/j.spmi.2014.10.022
https://fount.aucegypt.edu/faculty_journal_articles/1889

MLA Citation

Mkawi, E. M., et al. "Influence of precursor thin films stacking order on the properties of Cu₂ZnSnS₄ thin films fabricated by electrochemical deposition method." Superlattices and Microstructures, vol. 76, 2014, pp. 339–348.
https://fount.aucegypt.edu/faculty_journal_articles/1889