Title

Leakage power evaluation of FinFET-based FPGA cluster under threshold voltage variation

Author's Department

Electronics & Communications Engineering Department

Find in your Library

https://doi.org/10.1109/IDT.2016.7843029

Document Type

Research Article

Publication Title

International Design and Test Workshop

Publication Date

7-2-2016

doi

10.1109/IDT.2016.7843029

First Page

137

Last Page

141

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