Leakage power evaluation of FinFET-based FPGA cluster under threshold voltage variation
Author's Department
Electronics & Communications Engineering Department
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https://doi.org/10.1109/IDT.2016.7843029
Document Type
Research Article
Publication Title
International Design and Test Workshop
Publication Date
7-2-2016
doi
10.1109/IDT.2016.7843029
First Page
137
Last Page
141
Recommended Citation
APA Citation
El-Din, M.
Fahmy, H.
Ismail, Y.
Gamal, N.
&
Mostafa, H.
(2016). Leakage power evaluation of FinFET-based FPGA cluster under threshold voltage variation. International Design and Test Workshop, 137–141.
10.1109/IDT.2016.7843029
https://fount.aucegypt.edu/faculty_journal_articles/1324
MLA Citation
El-Din, Mohamed Mohie, et al.
"Leakage power evaluation of FinFET-based FPGA cluster under threshold voltage variation." International Design and Test Workshop, 2016, pp. 137–141.
https://fount.aucegypt.edu/faculty_journal_articles/1324