Catastrophic short and open fault detection in mos current mode circuits: A case study
Files
Department
Electronics & Communications Engineering Department
Description
[abstract not available]
Publication Date
12-1-2010
Document Type
Book Chapter
Book Title
BEC 2010 - 2010 12th Biennial Baltic Electronics Conference, Proceedings of the 12th Biennial Baltic Electronics Conference
ISBN
SCOPUS_ID:79952155366
Publisher
IEEE
City
Tallinn, Estonia
First Page
145
Last Page
148
Recommended Citation
APA Citation
Madian, A.
Amer, H.
&
Eldesouky, A.
(2010).Catastrophic short and open fault detection in mos current mode circuits: A case study. IEEE. , 145-148
https://fount.aucegypt.edu/faculty_book_chapters/741
MLA Citation
Madian, Ahmed H., et al.
Catastrophic short and open fault detection in mos current mode circuits: A case study. IEEE, 2010.pp. 145-148
https://fount.aucegypt.edu/faculty_book_chapters/741