Worst-case test vectors of sequential ASiCS exposed to total dose

Chapter Title

Worst-case test vectors of sequential ASiCS exposed to total dose

Files

Department

Electronics & Communications Engineering Department

Description

[abstract not available]

Publication Date

12-1-2011

Document Type

Book Chapter

Book Title

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

ISBN

SCOPUS_ID:84860160182

Publisher

IEEE

City

Seville, Spain

First Page

175

Last Page

181

Worst-case test vectors of sequential ASiCS exposed to total dose

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